| Product |
Product Title |
Product Description |
Order Number |
| |
MICRO-KLEPS schwarz/black |
Miniature clamp-type test probe with rotating grip jaws (SMD technology). The insulated shaft can be bent up to 35º. Suitable for very thin wires and densely packed contact points (1.27 mm IC spacing pitch). Connects with MKL... and MAL... |
973 972-100 |
| |
MICRO-KLEPS rot/red |
Miniature clamp-type test probe with rotating grip jaws (SMD technology). The insulated shaft can be bent up to 35º. Suitable for very thin wires and densely packed contact points (1.27 mm IC spacing pitch). Connects with MKL... and MAL... |
973 972-101 |
| |
KLEPS 3 ST schwarz/black |
Miniature clamp-type test probe with rotating grip jaws. Suitable for very thin wires and densely packed contacts. Connects with MKL... and MAL... |
973 592-100 |
| |
KLEPS 3 ST rot/red |
Miniature clamp-type test probe with rotating grip jaws. Suitable for very thin wires and densely packed contacts. Connects with MKL... and MAL... |
973 592-101 |